X-Ray Imaging · 3D Inspection · Material Analysis

See inside. Know more.

FIXS is redefining non-destructive testing and X-ray spectral analysis. A patented soft X-ray technology that reads what others cannot — instantly, and without touching the material.

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FIXS in motion

SOFT X-RAY· BLACK PLASTICS· MATERIAL FINGERPRINT· CIRCULAR ECONOMY· MILLISECOND ANALYSIS· PATENTED·
Our Vision

For decades, inspection technologies have stopped at the surface. We built something that looks all the way through the material — turning every object into data.

FIXS is a deep-tech spin-off of DSMechatronics, born from a single conviction: that the future of recycling, quality control and material science depends on seeing — and understanding — what's really there.

The Technology

A new way to read matter

FIXS harnesses the physics of soft X-rays to capture a unique signature of each material — its structure and its composition at once. Where conventional methods see only the surface or only the shape, FIXS reveals the full identity of the object.

Multi-physics in one shot

A single soft X-ray measurement combines several material interactions into one decisive read — no compromise between detail and speed.

Composition, not appearance

FIXS identifies the polymer and the elements within it — fillers, additives and contaminants — independently of colour, including the black plastics that defeat optical methods.

Built for the line

From a few milliseconds per object on a moving conveyor to precise benchtop and portable instruments — the same technology, scaled to your process.

Detector Technology

Born at CERN. Mastered by us.

FIXS is built around frontier hybrid-pixel X-ray detectors developed at CERN in Geneva and licensed for commercialisation — instruments so specialised that even large industrial players don't have access to them.

Compact Timepix3 detector — developed at CERN

Not just a sensor — a decade of know-how

Owning the detector is not enough: extracting its full potential demands rare, hands-on physics competence built over years of research at the world's leading laboratories. That competence is our real technology.

Energy-resolving single-photon counting
55 µm pixel · noise-free
Si & CdTe sensors · 2–100 keV
Miniaturised · ultra-high performance
Low-power · ~35 kV · 5–10 W
Confined beam · no radiological licensing
The Method

It starts from the defect

There is no universal setting. Every FIXS system is tailored — backwards from the exact feature you need to see. The defect defines the contrast; the contrast drives the energy, the detector, the geometry and the measurement time.

Progettazione del sistema di misura

Design loop: intensity, contrast, defect and measurement time are interdependent — balanced case by case, together with the detector parameters (spectrum, efficiency, count rate, spatial resolution).

01

The defect

Type, size and position of the feature to detect set the contrast the system must achieve.

02

Contrast physics

From the material (Z, density) and thickness we model transmission T = e^(−µt) and find the energy of maximum contrast.

03

Tailor the spectrum

Voltage, power, anode and filters are tuned to shape the X-ray spectrum for that specific defect.

04

Choose the detector

Si or CdTe sensor, energy resolution, efficiency, spatial resolution and count rate matched to the task.

05

Geometry & dynamics

Distances and magnification set resolution and measurement time — larger defects, faster scans — then a mechatronic prototype runs it in-line.

Capabilities

Specialised by design

2–50 keV
Soft X-ray domain
10–30 ms
Per-object analysis
t/h
Industrial throughput
0
Sample preparation
Applications

One technology, many frontiers

Wherever knowing the true identity of a material creates value, FIXS belongs.

01

Recycling & circular economy

Automatic sorting of post-consumer and industrial plastics — including WEEE and automotive streams — recovering value others send to waste.

02

Heterogeneous material sorting

Separating mixed flows of plastic, glass, wood, paper, rubber and metals in a single, fast pass.

03

Quality control & verification

Confirming polymer grade, fillers and additives in incoming or outgoing material — without destroying a single part.

04

Lab & portable analysis

Compact benchtop and handheld instruments for accurate characterisation of polymers and other materials in seconds.

Why FIXS

Where others stop, FIXS begins

A simple comparison against the inspection methods used today — without the trade-offs.

Capability
FIXS
Conventional methods
Identifies black plastics
Yes
Often fails
Reads composition & additives
Polymer + elements
Partial
Speed on the line
Milliseconds
Varies
Safety & HSE burden
Intrinsically high / low
Method-dependent
Sample preparation
None
Sometimes required

Indicative comparison vs. optical (NIR/FTIR/Raman), laser (LIBS) and other X-ray methods. Detailed benchmarking available under NDA.

Proven & Protected

From the lab to the industrial line

Black plastics can be up to half of the plastic leaving treatment plants — today mostly a cost. FIXS turns that fraction into recoverable, mono-polymer value, validated at industrial line speed.

~50%
of plastic output is black — recoverable
~2 m/s
validated line speed
t/h
industrial throughput
2 PCT
international patents
Part of a 5-patent deep-tech portfolio CERN-licensed detectors Delivered as DSM HybridScan®

Independently evaluated by leading European recyclers of WEEE and end-of-life-vehicle plastics.

The Inventors

Minds behind the patent

FIXS was conceived by a team uniting deep physics, advanced engineering and industrial innovation.

Salvatore Ramaglia
Innovation Architect & Engineer

Salvatore Ramaglia

Founder of DSMechatronics and architect of the FIXS vision — turning breakthrough physics into a product and a market.

LinkedIn
Danilo Pacella
Inventor

Dr. Danilo Pacella

PhD Physics with 30+ years in radiation physics, X-ray spectroscopy & imaging and detector science.

Research Director · ENEA · Associate · INFN ResearchGate
Federica Causa
Co-inventor

Dr. Federica Causa

PhD Physics with 25+ years in optoelectronics, photonics and X-ray imaging & diagnostics.

Physics & advanced sensing ResearchGate
Publications & Research

Minds of rare scientific depth

FIXS was invented by scientists with a lifetime of internationally recognised research in X-ray detection, spectroscopy and imaging. Their published work speaks for the level of expertise behind the technology.

Dr. Danilo Pacella

Inventor · X-ray detectors & imaging
Lead & selected works
67peer-reviewed publications — browse the full record
IOP Publishing10.1088/1748-0221/20/05/C05010 EPJ10.1140/epjp/s13360-023-04842-0 MDPI10.3390/condmat8040098 EPJ10.1140/epjp/s13360-023-04583-0 IOP Publishing10.1088/1748-0221/17/06/C06005 IOP Publishing10.1088/1748-0221/15/02/C02006 IOP Publishing10.1088/1741-4326/ab4ef1 IOP Publishing10.1088/1748-0221/14/09/C09012 AIP Publishing10.1063/1.5121290 IOP Publishing10.1088/1748-0221/14/08/C08010 IOP Publishing10.1088/1741-4326/ab1a1e IOP Publishing10.1088/1361-6587/aad7f5 IOP Publishing10.1088/1748-0221/12/10/C10012 IOP Publishing10.1088/1741-4326/aa7777 IOP Publishing10.1088/1741-4326/aa5e28 Nature10.1038/ncomms13493 AIP Publishing10.1063/1.4960405 Elsevier10.1016/j.cap.2016.03.007 IOP Publishing10.1088/1748-0221/11/05/C05011 IOP Publishing10.1088/1748-0221/11/03/C03042 Elsevier10.1016/j.nima.2015.11.062 IOP Publishing10.1088/1741-4326/55/10/104020 IOP Publishing10.1088/1748-0221/10/02/C02046 Dove Press10.2147/RMI.S50045 AIP Publishing10.1063/1.4890256 AIP Publishing10.1063/1.4890541 SciRP10.4236/mi.2014.33003 Elsevier10.1016/j.nima.2013.08.057 Elsevier10.1016/j.fusengdes.2012.07.018 AIP Publishing10.1063/1.4733532 IOP Publishing10.1088/1741-4326/51/9/094015 SIF10.1393/ncc/i2011-10976-8 AIP Publishing10.1063/1.3464464 Elsevier10.1016/j.nima.2010.04.039 AIP Publishing10.1063/1.3492260 IOP Publishing10.1088/0029-5515/49/5/055007 AIP Publishing10.1063/1.2965036 AIP Publishing10.1063/1.2965010 AIP Publishing10.1063/1.2838230 AIP Publishing10.1063/1.2838228 IOP Publishing10.1088/1748-0221/1/09/P09001 AIP Publishing10.1063/1.2190209 IOP Publishing10.1088/1402-4896/2006/T123/031 IOP Publishing10.1088/1742-6596/25/1/020 IOP Publishing10.1088/0741-3335/47/12B/S47 IOP Publishing10.1088/0029-5515/45/10/012 IOP Publishing10.1088/0741-3335/46/5A/031 IOP Publishing10.1088/0029-5515/43/12/014 Elsevier10.1016/j.nuclphysbps.2003.08.052 Elsevier10.1016/S0168-9002(03)01805-9 AIP Publishing10.1063/1.1578170 AAS10.1086/319721 AIP Publishing10.1063/1.1149519 APS10.1103/PhysRevE.61.5701 Naturencomms13493 SIFpapers.sif.it Connected Papers302d198b6f6489bf2daf84089e2881…

Dr. Federica Causa

Co-inventor · Photonics & plasma diagnostics
Lead & selected works
37peer-reviewed publications — browse the full record
Let's talk

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Contact us→ About DSMechatronics
A deep-tech spin-off of DSMechatronics