FIXS is redefining non-destructive testing and X-ray spectral analysis. A patented soft X-ray technology that reads what others cannot — instantly, and without touching the material.

For decades, inspection technologies have stopped at the surface. We built something that looks all the way through the material — turning every object into data.
FIXS is a deep-tech spin-off of DSMechatronics, born from a single conviction: that the future of recycling, quality control and material science depends on seeing — and understanding — what's really there.
FIXS harnesses the physics of soft X-rays to capture a unique signature of each material — its structure and its composition at once. Where conventional methods see only the surface or only the shape, FIXS reveals the full identity of the object.
A single soft X-ray measurement combines several material interactions into one decisive read — no compromise between detail and speed.
FIXS identifies the polymer and the elements within it — fillers, additives and contaminants — independently of colour, including the black plastics that defeat optical methods.
From a few milliseconds per object on a moving conveyor to precise benchtop and portable instruments — the same technology, scaled to your process.
FIXS is built around frontier hybrid-pixel X-ray detectors developed at CERN in Geneva and licensed for commercialisation — instruments so specialised that even large industrial players don't have access to them.

Owning the detector is not enough: extracting its full potential demands rare, hands-on physics competence built over years of research at the world's leading laboratories. That competence is our real technology.
There is no universal setting. Every FIXS system is tailored — backwards from the exact feature you need to see. The defect defines the contrast; the contrast drives the energy, the detector, the geometry and the measurement time.

Design loop: intensity, contrast, defect and measurement time are interdependent — balanced case by case, together with the detector parameters (spectrum, efficiency, count rate, spatial resolution).
Type, size and position of the feature to detect set the contrast the system must achieve.
From the material (Z, density) and thickness we model transmission T = e^(−µt) and find the energy of maximum contrast.
Voltage, power, anode and filters are tuned to shape the X-ray spectrum for that specific defect.
Si or CdTe sensor, energy resolution, efficiency, spatial resolution and count rate matched to the task.
Distances and magnification set resolution and measurement time — larger defects, faster scans — then a mechatronic prototype runs it in-line.
Wherever knowing the true identity of a material creates value, FIXS belongs.
Automatic sorting of post-consumer and industrial plastics — including WEEE and automotive streams — recovering value others send to waste.
Separating mixed flows of plastic, glass, wood, paper, rubber and metals in a single, fast pass.
Confirming polymer grade, fillers and additives in incoming or outgoing material — without destroying a single part.
Compact benchtop and handheld instruments for accurate characterisation of polymers and other materials in seconds.
A simple comparison against the inspection methods used today — without the trade-offs.
Indicative comparison vs. optical (NIR/FTIR/Raman), laser (LIBS) and other X-ray methods. Detailed benchmarking available under NDA.
Black plastics can be up to half of the plastic leaving treatment plants — today mostly a cost. FIXS turns that fraction into recoverable, mono-polymer value, validated at industrial line speed.
Independently evaluated by leading European recyclers of WEEE and end-of-life-vehicle plastics.
FIXS was conceived by a team uniting deep physics, advanced engineering and industrial innovation.

Founder of DSMechatronics and architect of the FIXS vision — turning breakthrough physics into a product and a market.
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PhD Physics with 30+ years in radiation physics, X-ray spectroscopy & imaging and detector science.
Research Director · ENEA · Associate · INFN ResearchGate
PhD Physics with 25+ years in optoelectronics, photonics and X-ray imaging & diagnostics.
Physics & advanced sensing ResearchGateFIXS was invented by scientists with a lifetime of internationally recognised research in X-ray detection, spectroscopy and imaging. Their published work speaks for the level of expertise behind the technology.
We work with recyclers, manufacturers and research partners who want to inspect what was, until now, invisible. Tell us your challenge.